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Decap
To verify the device logo , part number, design time, bonding lines, and others
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X-Ray Test
Without damaging the chip, detect the packaging of components, such as bubbles, abnormal bond line, die size, bracket direction, etc
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RoHS Test
Test whether various chemical elements meet international standards
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Reliability Test
Test the ability of the device to withstand high temperature, low temperature, cold and hot shock environment
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Electrical Test
Test the electrical performance parameters of components in non-working state, including pin open circuit test, pin short circuit, Idd test, DC Leakage, and pin matching
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Program Test
Program, verify, Erase, burn procedures, blank check, one-time device check
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IGBT Test
Verify the parameters of IGBT according to the specification
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Baking and Dry Packing
The device is baked at high temperature and vacuum-packed according to the requirements of humidity sensitivity level
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