Check whether the marking, main body and leads of components meet the standard
MoreWithout damaging the chip, detect the packaging of components, such as bubbles, abnormal bond line, die size, bracket direction, etc
MoreTest the ability of the device to withstand high temperature, low temperature, cold and hot shock environment
MoreTest the electrical performance parameters of components in non-working state, including pin open circuit test, pin short circuit, Idd test, DC Leakage, and pin matching
MoreVerify the high frequency characteristics of microwave chip according to specifications
MoreThe device is baked at high temperature and vacuum-packed according to the requirements of humidity sensitivity level
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