Check whether the marking, main body and leads of components meet the standard
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Without damaging the chip, detect the packaging of components, such as bubbles, abnormal bond line, die size, bracket direction, etc
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Test the ability of the device to withstand high temperature, low temperature, cold and hot shock environment
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Test the electrical performance parameters of components in non-working state, including pin open circuit test, pin short circuit, Idd test, DC Leakage, and pin matching
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Verify the high frequency characteristics of microwave chip according to specifications
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The device is baked at high temperature and vacuum-packed according to the requirements of humidity sensitivity level
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